Study of the minerals on the PbS-Sb_2S_3 join : Part1: Phese reration above 400℃
スポンサーリンク
概要
- 論文の詳細を見る
- 1995-04-01
著者
-
Kitakaze Arashi
Institue Of Mineralogy Petrology And Economic Geology Facalty Of Science Tohoku University
-
Kitakaze Arashi
Faculty Of Science Tohoku University
-
SHIMA Hiromi
Department of Applied Physics, Faculty of Science, Tokyo University of Science
-
Shima Hiromi
Department Of Mining Engineering Faculty Of Engineering Yamaguchi University
関連論文
- Composition dependence of electrooptic property of epitaxial (Pb,La)(Zr,Ti)O3 films
- Growth and Characterization of Silver Thiogallate(AgGaS_2)Crystals by the Hydrothermal Method
- Thermooptic Property of Polycrystalline BiFeO3 Film
- Study of the minerals on the PbS-Sb_2S_3 join : Part1: Phese reration above 400℃
- Synthetic Phases in the PbS-Bi_2S_3 System; PbBi_4S_7 and Pb_2Bi_2S_5 (Synthetic Sulfide Minerals (VII))
- Synthesized lead bismuth sulfosalts minerals; heyrovskyite, lillianite and galenobismutite (synthetic sulfide minerals (VI))
- Synthetic sulfide minerals (V)
- Phase Relations of the Cu_2S-Sb_2S_3 System
- Synthetic sulfide minerals (IV)
- Synthetic Sulfide Minerals (I)
- Phase Relations of the Cu_2S-Bi_2S_3 System
- Annealing Temperature Dependences of Ferroelectric and Magnetic Properties in Polycrystalline Co-Substituted BiFeO3 Films
- Synthetic Sulfide Minerals (III)
- Optical Properties of BiFeO3-System Multiferroic Thin Films
- Investigation of Sputtering Damage in SrRuO3 Films Prepared by Sputtering with Raman and X-ray Photoemission Spectroscopies
- Preparation and Characterization of Ba(ZrxTi1-x)O3 Thin Films Using Reactive Sputtering Method
- Electrooptic and Piezoelectric Properties of (Pb,La)(Zr,Ti)O3 Films with Various Zr/Ti Ratios
- La Content Dependence of Electrooptic Properties of Polycrystalline (Pb,La)(Zr0.65,Ti0.35)O3 Thick Films