Leakage Current and Fatigue Properties of Pb(Zr, Ti)O_3 Ferroelectric Films Prepared by RF-Magnetron Sputtering on Textured LaNiO_3 Electrode
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概要
- 論文の詳細を見る
- Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
- 2001-04-01
著者
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Wu J‐m
National Tsing Hua Univ. Hsinchu Twn
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Wu Jenn-ming
Department Of Materials Science And Engineering National Tsing Hua University
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Wu Jenn-ming
Department Of Materials Science And Engineering National Tsing-hua University
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Chao Gwo-chin
Department Of Materials Science And Engineering National Tsing-hua University
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Chao Gwo-chin
Department Of Materials Science And Engineering National Tsing Hua University
関連論文
- Crystallization Characteristics of LaNiO_3 Layers and Their Effect on Pulsed Laser Deposited (Pb_La_x)(Zr_yTi_)O_3 Thin Films
- Effects of (100)-Textured LaNiO_3 Electrode on Crystallization and Properties of Sol-Gel-Derived Pb(Zr_Ti)O_3 Thin Films
- Ferroelectric and Dielectric Characteristics of (Pb_La_y)[Mg_/3Nb_/3Ti_]O_3 Thin Films Prepared by RF Magnetron Sputtering
- Effect of Powder Characteristics on Electrical Properties of (Ba, Bi, Nb)-Added TiO2 Ceramics
- Leakage Current and Fatigue Properties of Pb(Zr, Ti)O_3 Ferroelectric Films Prepared by RF-Magnetron Sputtering on Textured LaNiO_3 Electrode
- Effect of LaNiO_3 Electrode on Electrical Properties of RF-Magnetron-Sputtered Pb(Zr, Ti)O_3 Ferroelectric Thin Films
- RF-Magnetron Sputtered Conductive Perovskite BaPbO3 Films
- Effect of Reducing Atmosphere on Electrical Properties of Sol-Gel-Derived Pb(Zr,Ti)O_3 Ferroelectric Films On Textured LaNiO_3 Electrode : Surfaces, Interfaces, and Films
- Sol-Gel Derived Pb(Zr,Ti)O3 Heterolayered Films by Single-Annealing
- Rf-Magnetron Sputtering of Titanium Dioxide for Microelectronic Applications
- Crystallization Characteristics of LaNiO3 Layers and Their Effect on Pulsed Laser Deposited (Pb 1-xLax)(ZryTi 1-y)O 3 Thin Films
- Leakage Current and Fatigue Properties of Pb(Zr, Ti)O3 Ferroelectric Films Prepared by RF-Magnetron Sputtering on Textured LaNiO3 Electrode