Electrooptical Study of an In-Plane Switching Mode Using a Uniaxial Medium Model

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A new modeling method using a uniaxial medium model has been proposed to obtain a simple and quantitative expression for the transmittance of an in-plane switching (IPS) mode. In this model, the effective birefringence ($\varDelta n_{\text{eff}}$) and the apparent optic axis rotation angle ($\phi_{\text{app}}$) are used instead of the original birefringence and the director profile, and $\varDelta n_{\text{eff}}$ changes when an electric field is applied to the IPS mode cell. The dependences of $\varDelta n_{\text{eff}}$ (measured as a retardation) and $\phi_{\text{app}}$ on the applied voltage have been evaluated first by experiment. $\varDelta n_{\text{eff}}$ was reduced to 80% of the original value and $\phi_{\text{app}}$ rotated 45° at the maximum transmittance ($T_{\text{max}}$). It has been confirmed that the transmittance can be reproduced satisfactorily by employing the model’s expression using the observed $\varDelta n_{\text{eff}}$ and $\phi_{\text{app}}$ values. Theoretical simulation has also been executed and the results supported the experimental results. The simulation has also shown that both the $\varDelta n_{\text{eff}}$–$\varDelta n$ ratio and $\phi_{\text{app}}$ at $T_{\text{max}}$ are almost constant and do not depend on either the cell gap or liquid-crystal properties. $T_{\text{max}}$ can be easily calculated using the uniaxial medium model.
Publication Office, Japanese Journal of Applied Physics, Faculty of Science, University of Tokyoの論文
2001-01-15

Electrooptical Study of an In-Plane Switching Mode Using a Uniaxial Medium Model

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