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The Oarai Center, Institute for Materials Research, Tohoku University | 論文
- Nanostructural Evolution of Cr-rich Precipitates in a Cu-Cr-Zr Alloy During Heat Treatment Studied by 3 Dimensional Atom Probe
- Channel Dopant Distribution in Metal--Oxide--Semiconductor Field-Effect Transistors Analyzed by Laser-Assisted Atom Probe Tomography
- Delocalized Positronium in BaF2
- Three-Dimensional Elemental Analysis of Commercial 45nm Node Device with High-k/Metal Gate Stack by Atom Probe Tomography
- Three-Dimensional Characterization of Deuterium Implanted in Silicon Using Atom Probe Tomography
- Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65 nm Node by Atom Probe Tomography
- Three-Dimensional Dopant Characterization of Actual Metal-Oxide-Semiconductor Devices of 65nm Node by Atom Probe Tomography