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Tdk Corp. Chiba | 論文
- Improved Stability of Metal-Insulator-Diamond Semiconductor Interface by Employing BaF_2 Insulator Film
- Deep-Level Transient Spectroscopy of Interface States in ZnO/PrCoO_x/ZnO Thin-Film Junctions
- Additional Bias Effects on the Formation of Amorphous Hydrogenated Carbon Films by ECR
- Electrical Properties of Al/CaF_2/i-Diamond Metal-Insulator-Semiconductor Field-Effect-Transistor Fabricated by Ultrahigh Vacuum Process
- Mechanical properties of 3Y-ZrO_2 and 8Y-ZrO_2 films by rf sputtering