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State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027, P. R. China | 論文
- Effect of Rapid Thermal Process on Oxygen Precipitation in Heavily Boron-Doped Czochralski Silicon Wafer
- Bipolar Structure in Thermally Treated Czochralski Silicon Wafer
- Effect of Nitrogen Doping on Oxygen Precipitate Profiles in Czochralski Silicon Wafer
- Grown-in Defects in Heavily Boron-Doped Czochralski Silicon