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Sony Co. Atsugi‐shi Jpn | 論文
- Initial Measurements from an Ultrashort-Pulse Reflectometer on GAMMA 10
- Application of Wavelet Analysis to Plasma Fluctuation Study on GAMMA 10
- Development of an Ultrashort-Pulse Reflectometer for Density Profile Measurements on GAMMA 10
- Deep UV Mastering with a Write Compensation Technique Realizing over 20GB/layer Capacity Disc
- Organotin-Containing Resists (TMAR) for X-Ray Lithography : Resist Material and Process
- Organotin-Containing Resists (TMAR) for X-Ray Lithography
- Deep UV Mastering Using an All-Solid-State 266 nm Laser for an over 20 GBytes/Layer Capacity Disk
- Disk Mastering Process with an All-Solid-State Ultraviolet Laser
- Second-Harmonic Generation Green Laser for Higher-Density Optical Disks