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Siemens AG, Research Laboratories | 論文
- Leakage Current Reduction in Buried Heterostructure Tunable Twin-Guide Laser Diodes
- Thin Film Evaluation Techniques for the ESFI SOS Technology
- Confirmation of Tunneling Current via Traps by DLTS Measurements in InGaAs Photodiodes
- Narrow-Linewidth InGaAsP/InP Metal-Clad Ridge-Waveguide Distributed Feedback Lasers
- High Performance 880 nm (GaAl)As/GaAs Oxide Stripe Lasers with Very Low Degradation Rates at Temperatures up to 120℃
- Segregation of Zinc in InGaAs/InP Heterostructures During Diffusion: Experiment and Numerical Modeling