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School of Materials Science and Engineering, Seoul National University | 論文
- Electrical characterization of indium-rich InGaN/GaN multi quantum wells (Electron devices: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Electrical characterization of indium-rich InGaN/GaN multi quantum wells (Silicon devices and materials: 第15回先端半導体デバイスの基礎と応用に関するアジア・太平洋ワークショップ(AWAD2007))
- Invited Nitride Semiconductor Nanostructures and Their Optical Properties (先端デバイスの基礎と応用に関するアジアワークショップ)
- [Invited] Nitride Semiconductor Nanostructures and Their Optical Properties (AWAD2003 (Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices))
- Effects of Titanium and Oxygen Content on Microstructure in Low Carbon Steels
- Non-Metallic Inclusions and Acicular Ferrite in Low Carbon Steel
- Characteristics of Inclusions and Precipitates in Low Carbon Steels
- Hot Deformation and Acicular Ferrite Microstructure in C-Mn Steel Containing Ti_2O_3 Inclusions
- Hot deformation and acicular ferrite microstructure in C-Mn steelcontaining Ti_2O_3inclusions
- Non-metallic inclusions and Acicular Ferrite in Carbon-Manganese Steel
- Thickness Effects on the Pyroelectric Properties of Chemical-Solution-Derived Pb(Zr_0.3,Ti_0.7)O_3 Thin Films for the Infra-Red Sensor Devices
- Thermal and Phase Behavior of Polyurethane Based on Chain Extender, 2, 2-Bis-[4-(2-hydroxyethoxy) phenyl] propane
- Variant Selection in Mechanically-induced Martensitic Transformation of Metastable Austenitic Steel
- Evaluation of Dislocation Density from the Flow Curves of Hot Deformed Austenite
- FEM Modeling of Flow Curves for Ferrite/Pearlite Two-Phase Steels
- Reduction of the threshold voltage fluctuation in an electrical phase change memory device with a Ge_1Sb_2Te_4 / TiN cell structure
- Incorporation of Short Chain Alkylamine in Template Micelle during MCM-41 Formation Process
- Effect of Short-Chain Alkylamine on Micelle Structure in MCM-41 Synthesis Process
- Synthesis of Nano-Sized WC-Co Powders by Reduction-Carburization Process
- Dielectric and Electromechanical Properties of Pb(Zr,Ti)O_3 Thin Films for Piezo-Microelectromechanical System Devices