スポンサーリンク
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan | 論文
- X-ray Interference Fringes from Weakly Bent Crystal
- Amplification of Reflected X-ray Beams by the Mirage Effect
- Electron-Beam-Induced Deposition of Fe Nanoparticles and Thin Films on SrTiO3 Substrates
- Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
- X-ray Interference Fringes in Transmitted Beam of Bragg Mode from Very Weakly Bent Crystal
- Determination of Constant Strain Gradients of Elastically Bent Crystal Using X-ray Mirage Fringes