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Research Institute Of Electrical Communication Tohoku University:riken Photodynamics Research Center | 論文
- Spectroscopic Evidence for Energy Loss of Photoelectrons Interacting with Image Charge(Condensed matter: structure and mechanical and thermal properties)
- Study of α-Sexithienyl Thin Film by Polarized Near Edge X-ray Absorption Fine Structure
- Preparation and Characterization of 3,4,9,10-Perylenetetracarboxylic dianhydride (PTCDA) Films Deposited by Organic Molecular Beam Deposition Method
- Molecular Oriented Thin Film of Biphenyl-4,4'-dithiol Fabricated by Molecular Beam Deposition Method
- Light Emission from Si-Metal-Oxide-Semiconductor Tunnel Junctions
- Scanning Tunneling Microscope Light Emission Mechanism of Pb(Surfaces, Interfaces, and Films)
- Preparation and Properties of SrBi_2Ta_2O_9 Ceramics
- Electrical and Mechanical Characteristics of Pb_nBi_4Ti_O_ Ceramics
- Grain-Oriented Ceramics in Bismuth Layer-Structure Compounds for Capacitor Material
- Grating-Coupled Light Emission from the Slow Mode of Metal-Insulator-Metal Tunnel Junctions
- Derivative Spectra of Very Low Energy Photoelectrons from CO/Cu(001) Surface Obtained by a Lock-in Technique(Atomic and molecular physics)
- Surface Optical Second Harmonic Generation from Rutile TiO_2(110) in Air
- Comparison of Light-Emission Efficiencies from Si-Metal-Oxide-Semiconductor Junctions and from Si in Scanning Tunneling Microscopy
- Theory of Visible Light Emission from Scanning Tunneling Microscope
- Optical Observation of Single-Electron Charging Effect at Room Temperature
- High Resolution Time-of-Flight Electron Spectrometer
- Optical characterization of individual semiconductor nanostructures using a scanning tunneling microscope