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NTT Applied Electronics Laboratories | 論文
- YBaCuO Epitaxial Film Formation by Magnetron Sputtering with Facing Targets : I. Effects of Target and Substrate Positions
- Ultrasonic Measurement on the Single Crystal La_Sr_CuO_4 : Physical Acoustics
- Tracer for Ultrasonic Flow Visualization of Water/Solid Microparticle Suspension
- Analysis of Magnetic Grating Recording Process on Magneto-Optical Media : FUTURE TECHNOLOGY
- Dynamic Analysis of Flying Head Sliders with Ultra-Thin Spacing Based on the Boltzmann Equation : Comparison with Two Limiting Approximations
- Deposition and Tribology of Carbon and Boron Nitride Super Lattice Solid Lubricant Films
- Largely Anisotropic Superconducting Critical Current in Epitaxially Grown Ba_2YCu_3O_ Thin Film
- Electromagnetic Coupling Effects in BaPb_Bi_O_3 Two-Dimensional Josephson Tunnel Junction Arrays
- A Novel Discrete Current Behavior in the Current-Voltage Curve for Superconducting BaPb_Bi_O_3 Films
- Hall Effect Measurements on Fine-Grain Poy-Si Thin-Film Transistors Made from Laser-Irradiated Sputter-Deposited Si Film
- Electrical Characteristics of High-Mobility Fine-Grain Poly-Si TFTs from Laser Irradiated Sputter-Deposited Si Film
- Unusual Voltage-Current Characteristic in the Superconducting Transition Region in TaSe_3
- As-Deposited Superconducting Ba_2YCu_3O_ Films Using ECR Ion Beam Oxidation : Electrical Properties of Condensed Matter
- Improvement in Thermal Properties of a Multi-Beam Laser Diode Array : COMPONENTS
- Crystallization Characteristics of Phase-Change Optical Disks
- Surface Structure of InAs (001) Treated with (NH_4)_2S_x Solution
- Diffusion Barrier Mechanism of Extremely Thin Tungsten Silicon Nitride Film Formed by ECR Plasma Nitridation
- Polarized Extended X-Ray Absorption Fine Structure of High-T_c Superconducting Single-Crystal YBa_2Cu_3O_y : Electrical Properties of Condensed Matter
- Localized Orientation Control in BiSrCaCuO Superconducting Film
- DLTS Measurement on Electron-Irradiated GaAs-on-Si