スポンサーリンク
Korea Res. Inst. Standards And Sci. Taejon Kor | 論文
- Microstructure and Microwave Dielectric Properties of Ba(Co_Nb_)O_3 Ceramics
- Microstructures in Complex Perovskite (Li_Ln_)TiO_3 (Ln = Pr, Nd, Sm)
- Microstructural Changes in (1-x)Nd_TiO_3-xNdAlO_3 System
- Correlated Electrical Transport through Multiwall Carbon Nanotubes in a Crossed Geometry : Condensed Matter: Electronic Properties, etc.
- Non-Local Transport in a Multi-Wall Carbon Nanotube : Condensed Matter: Electronic Properties, etc.
- Memory Effect in an Aluminum Single-Electron Floating-Node Memory Cell
- Low Noise Directly-Coupled High T_c dc Superconducting Quantum Interference Device Magnetometers for Magnetocardiogram
- Surface Properties of a YBa_2Cu_3O_ Thin Film After Photo-Lithographic Treatment
- Characteristics of Directly-Coupled High-T_c Superconducting Quantum Interference Device Magnetometers for Multichannel Applications
- Surface Resistance Measurement on YBCO Thin Film and Bulk Plate by a Modified Parallel-Plate Resonator Method
- Analysis on Read-Out Signal in Magnetooptieal Disc Drive System
- Effect of Structural Changes on the Microwave Dielectric Properties of Ba(Zn_Nb_)O_3 Ceramics
- A New, Low-Thermal-Budget Planarization Scheme for Pre-Metal Dielectric Using Electron-Beam Cured Hydrogen Silsesquioxane in Device
- A Novel and Low Thermal Budget Planarization Scheme for Pre-Metal Dielectric Using Electron-Beam Cured HSQ (Hydrogen Silsesquioxane) in STC (Stacked Capacitor) DRAM
- High-Performance Strain-Compensated Multiple Quantum Well Planar Buried Heterostructure Laser Diodes with Low Leakage Current
- Hydrogenation and Annealing Effects on GaN Epilayers Grown on Sapphire Substrates
- Fast EM Evaluation by Highly Accelerated Current Density
- Fast EM Evaluation by Highly Accelerated Current Density
- Fast EM Evaluation by Highly Accelerated Current Density
- W-Plug Common Contact with CoSi_2 Ohmic Layer for Scaled DRAM and Merged DRAM in Logic (MDL) Devices