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Joint Research Center for Atom Technology | 論文
- Room Temperature Nanoimprinting Using Release-Agent Spray-Coated Hydrogen Silsesquioxane
- Orbital and Charge Ordering in La_Sr_MnO_4 (0.4≤x≤0.5) : Condensed Matter: Electronic Properties, etc.
- Amorphous-to-Polycrystalline Silicon Transition in Hot Wire Cell Method
- Resonant X-ray Study on the Bi-Layered Perovskite Mn Oxide LaSr_2Mn_2O_7
- Orbital and Charge Ordering in LaSr_2Mn_2O_7 Observed by Resonant X-Ray Scattering : Condensed Matter: Electronic Properties, etc.
- Fabrication of Nanomanipulator with SiO_2/DLC Heterostructure by Focused-Ion-Beam Chemical Vapor Deposition
- Characteristics of Nano-Electrostatic Actuator Fabricated by Focused Ion Beam Chemical Vapor Deposition
- Fabrication of Standard Samples for Single-Molecule Fluorescence Imaging
- Novel Hall-Coefficient Behavior in Superconducting Sr_2RuO_4
- Electron-Beam-Induced Selective Thermal Decomposition of Ultrathin SiO_2 Layers Used in Nanofabrication
- Comparison of Young's Modulus Dependency on Beam Accelerating Voltage between Electron-Beam- and Focused Ion-Beam-Induced Chemical Vapor Deposition Pillars
- Growth Manner and Mechanical Characteristics of Amorphous Carbon Nanopillars Grown by Electron-Beam-Induced Chemical Vapor Deposition
- Position-Controlled Carbon Fiber Growth Catalyzed Using Electron Beam-Induced Chemical Vapor Deposition Ferrocene Nanopillars
- Three-Dimensional Nanoimprint Mold Fabrication by Focused-Ion-Beam Chemical Vapor Deposition
- Mossbauer Study on the Ordered Double Perovskite A_2FeReO_6 (A = Ca, Sr)
- Mossbauer Study on the Ordered Double Perovskite A_2FeReO_6 (A=Ca, Sr)
- Structural Distortion on Metal-Insulator Transition in Ordered Double Perovskite Ca_2FeReO_6
- Structural Distortion on Metal-Insulator Transition in Ordered Double Perovskite Ca_2FeReO_6
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy