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Japan Synchrotron Research Institute | 論文
- Elongational crystallization of isotactic polypropylene forms nano-oriented crystals with ultra-high performance
- Development of High-Angular-Resolution Microdiffraction System for Reciprocal Space Map Measurements
- Complex Made from Tetrasodium N,N-Bis(carboxylatomethyl) Glutamate and Sodium Oleate that Forms a Highly Ordered Lamella in Gel Phase
- Three-Dimensional Reconstruction of Atoms in Surface X-Ray Diffraction
- Formation of Ultra-High-Density Ferromagnetic Column Arrays Beyond 1 Tera/inch^2 Using Porous Alumina Template(Nano-Fabrication and Patterned Media)
- Small-angle X-ray Scattering from Multi-walled Carbon Nanotubes (CNTs) Dispersed in Polymeric Matrix
- Molecular Aggregation State of Surface-grafted Poly{2-(perfluorooctyl)ethyl acrylate} Thin Film Analyzed by Grazing Incidence X-ray Diffraction
- Development of Synchrotron DSC/WAXD/SAXS Simultaneous Measurement System for Polymeric Materials at the BL40B2 in SPring-8 and its Application to the Study of Crystal Phase Transitions of Fluorine Polymers
- Atomic-Resolution X-Ray Fluorescence Holography of Zn(0.02wt%)in a GaAs Wafer
- Synthesis of a Highly Hydrophobic Cationic Lipid and Structural and Thermodynamic Studies for Interaction with DNA
- Analysis of Molecular Aggregation States in Pentacene Thin Films Prepared from Soluble Precursor
- Molecular Aggregation Structure of Poly(fluoroalkyl acrylate) Thin Films Evaluated by Synchrotron-sourced Grazing-incidence X-ray Diffraction
- Cation-specific Transition from Vesicle to Lamella for an Aromatic Diamine Lipid in Aqueous Solutions
- Evaluation of Internal Stresses in Single-, Double- and Multi-Layered TiN and TiAIN Thin Films by Synchrotron Radiation(Advanced Technology of Experimental Mechanics)
- OS4(P)-16(OS04W0240) Measurement of Residual Stress in Nano-Size Copper Thin Films by Synchrotron Radiation
- OS4(P)-13(OS04W0205) Evaluation of Residual Stress in TiN Thin Films Deposited by Arc-Ion-Plating with Synchrotron Radiation
- OS4(5)-22(OS04W0203) Evaluation of Internal Stresses in Single-, Double- and Multi-Layered TiN and TiAlN Thin Films by Synchrotron Radiation
- Structural characterization of Ar[+]-irradiated SrTiO3 showing room-temperature blue luminescence
- 27aXE-7 Ge(001) : Te 1×1 surface structure probed using X-ray scattering
- X-Ray Structural Study of Ge(001):Te 1×1 Performed at the Advanced Photon Source. II. Current Status of the Surface-Interface Structure Beamline at SPring-8