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Institute Of Industrial Science University Of Tokyo:core Research For Evolutional Science And Techno | 論文
- Profile structure of magnetic flux lines in type-II superconductor from a rectangular electron hologram
- Time-resolved observation in transmission electron microscopy by means of spatially resolved electron correlation spectroscopy
- Observation of a 0.055 nm Spacing Lattice Image in Gold using a Field Emission Electron Microscope
- Observation of Atomic Steps by Reflection Electron Holography : Techniques, Instrumentations and Measurement
- Interference Electron Microscopy by Means of Holography
- Spherical-Aberration Correction of an Electron Lens by Holography
- High Resolution Electron Holography with Field Emission Electron Microscope
- Degradation of Dithiocarbamate Fungicide Polycarbamate in Upland Soils
- Fabrication of Micromechanical Tunneling Probes and Actuators on a Silicon Chip
- A Digital-to-Analog Converter of Displacement by an Integrated Micromechanism
- Fabrication of Less Than a 10 nm Wide Polycrystalline Silicon Nano Wire
- Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
- Characteristics of Nanoscale Lithography Using Atomic Force Microscope with Current-Controlled Exposure System
- Control of Surface Current on a Si(111) Surface by Using Nanofabrication
- Theoretical Study of Ga Adsorbates around Dangling-Bond Wires on am H-Terminated Si Surface: Possibility of Atomic-Scale Ferromagnets
- Initial Stage of Molecular Adsorption on Si(100) and H-terminated Si(100) Investigated by UHV-STM(STM-Si(001))
- Scanning Tunneling Spectroscopy of Dangling-Bond Wires Fabricated on the Si(100) -2 × 1 -H Surface
- Property Change of Si(111) Surface by Scanning Tunneling Microscope Manipulation
- Evaluation of Thin Silicon Dioxide Layers by Beam Assisted Scanning Tunneling Microscope
- Observation of Threefold Symmetry Images due to a Point Defect on a Graphite Surface Using Scanning Tunneling Microscope (STM)