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Hitachi Ltd. Saitama Jpn | 論文
- Fabrication Process of Fine Electrodes Using Shadow Mask Evaporation and Tip-Induced Local Oxidation
- Strain-Imaging Observation of Pb(Zr, Ti)O_3 Thin Films
- Strain Imaging of Lead-Zirconate-Titanate Thin Film by Tunneling Acoustic Microscopy
- Novel Method for Detecting Resonant Frequency Shift in Atomic Force Microscopy
- Fabrication of Pd(Zr, Ti)O_3 Microscopic Capacitors by Electron Beam Lithography
- Electrical Characteristics of HoBa_2Cu_3O_-La_Ba_Cu_3O_-HoBa_2Cu_3O_ Junctions with Planar-Type Structures
- Metal-Insulator Transition Induced by the Size Effect in Oxide S-N-S Junctions
- Nanofabrication Using Atomic Force Microscopy Lithography for Molecular Devices
- Dot-Array Resist Patterning Using Scanning Probe Microscopy with a Hybrid Current-Voltage Control Method
- Combining Atomic Force Microscopic Lithography with Photolithography
- Fabrication of High-Resolution and High-Aspect-Ratio Patterns on a Stepped Substrate by Using Scanning Probe Lithography with a Multilayer-Resist System
- Fabrication of High-Resolution and High-Aspect-Ratio Patterning on a Stepped Substrate by Scanning Probe Lithography Using a Multilayer-Resist System
- Characteristics of Nanoscale Lithography Using AFM with a Current-Controlled Exposure System
- Characteristics of Nanoscale Lithography Using Atomic Force Microscope with Current-Controlled Exposure System
- Direct Imaging of Thermodynamic Process In Atom Migration by Using Scanning Tunneling Microscopy
- Reduced Density of Missing-Dimer Vacancies on Tungsten-Contaminated Si (100)-(2×n) Surface by Hydrogen Termination
- Control of Surface Current on a Si(111) Surface by Using Nanofabrication
- Initial Stage of Molecular Adsorption on Si(100) and H-terminated Si(100) Investigated by UHV-STM(STM-Si(001))
- Scanning Tunneling Spectroscopy of Dangling-Bond Wires Fabricated on the Si(100) -2 × 1 -H Surface
- Property Change of Si(111) Surface by Scanning Tunneling Microscope Manipulation