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Graduate School of Engineering, Oita University | 論文
- A Single-Electron-Transistor Logic Gate Family for Binary, Multiple-Valued and Mixed-Mode Logic(New System Paradigms for Integrated Electronics)
- A Simulation Methodology for Single-Electron Multiple-Valued Logics and Its Application to a Latched Parallel Counter
- Fabrication of double-dot single-electron transistor in silicon nanowire
- Fabrication of double-dot single-electron transistor in silicon nanowire
- Transfer and Detection of Single Electrons Using Metal-Oxide-Semiconductor Field-Effect Transistors(Emerging Devices,Fundamentals and Applications of Advanced Semiconductor Devices)
- Multifunctional Boolean Logic Using Single-Electron Transistors(New System Paradigms for Integrated Electronics)
- Multifunctional device by using a quantum dot array
- Theoretical study of heat generation due to viscous dissipation in adiabatic packed-bed forced-convection flow
- Development of adaptive self-driving control strategies for an intelligent mobile vehicle
- AE and surface damage on machining with single-point-grinder in fine ceramics
- Use of finite element method for comparison of sound field diffuseness in reverberation rooms with and without absorption materials
- Ensemble averaged surface normal impedance measurement method in a reverberation room
- Effect of viscous dessipation on forced-convection heat transfer in cylindrical packed-beds
- Modeling of hydrodynamic dispersion and turbulence of fully-developed forced-convective flow in cylindrical packed beds
- Experimental study of pool film boiling heat transfer from a horizontal surface facing downward
- In situ measurements of absorption characteristics using two microphones and environmental "anonymous" noise
- Finite Element Sound Field Analysis of Diffuseness in Reverberation Rooms
- Adaptive fault-detector of power systems based on feedback linearization approach
- Bayesian Approach for Hierarchical Generalized Linear Models.(Session 4a)
- Measurement method with a pressure-velocity sensor for measuring surface normal impedance of materials using ensemble averaging: Comparison with other methods and its geometrical configuration