スポンサーリンク
Devices And Materials Laboratory Lg Corporate Institute Of Technology | 論文
- Characterization of Amorphous Phases of Ge_2Sb_2Te_5 Phase-Change Optical Recording Material on Their Crystallization Behavior
- Crystal Structure and Microstructure of Nitrogen-Doped Ge_2Sb_2Te_5 Thin Film
- Suppression of Jitter Bump GeSbTe Phase-Change Optical Disk
- X-Ray Photoelectron Spectroscopy Study of Pt-Oxide Thin Films Deposited by Reactive Sputtering Using O_2/Ar Gas Mixtures
- Investigation of Crystallization Behavior of Sputter-Deposited Nitrogen-Doped Amorphous Ge_2Sb_2Te_5 Thin Films
- Effect of Oxygen to Argon Ratio on Growth of Bi_4Ti_3O_ Thin Films on Ir and IrO_2 Prepared by Radio-Frequency Magnetron Sputtering