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Department of Physics, Faculty of Science, Hiroshima University | 論文
- Superconductivity in YBa_2Cu_Ni_yO_
- Analysis of Crystal Structure of an Y-Ba-Cu Oxide
- Contact Electrification on Thin SrTiO_3 Film by Atomic Force Microscope
- Concentration Dependence of Specific Heat of Ce_xLa_Cu_6 : II. LOW TEMPERATURE PROPERTIES OF SOLIDS : Heavy Electrons : Experiments
- Heavy Quark Effects in the Virtual Photon Structure Functions(Particles and Fields)
- ESR Study of Neutron-Irradiated LiCl Crystals
- Anomalous Corrugation Height of Atomically Resolved AFM Images of a Graphite Surface
- Simultaneous Observation of Atomically Resolved AFM/STM Images of a Graphite Surface
- Surface Conductance of Metal Surfaces in Air Studied with a Force Microscope
- Specific Heat of a New Dense-Kondo System CeTIn (T=Ni,Pb,Pt)
- Atom-selective imaging and mechanical atom manipulation using the non-contact atomic force microscope
- WS-02 ATOMIC MANIPULATION AND IDENTIFICATION USING NONCONTACT ATOMIC FORCE MICROSCOPE
- Carbon-Nanotube Tip for Highly-Reproducible Imaging of Deoxyribonucleic Acid Helical Turns by Noncontact Atomic Force Microscopy
- Structures of an Oxygen-Deficient TiO_2(110) Surface Studied by Noncontact Atomic Force Microscopy
- Missing Ag Atom on Si(111)√×√-Ag Surface Observed by Noncontact Atomic Force Microscopy
- Optical Near-Field Imaging Using the Kelvin Probe Technique
- New Computed Tomography Algorithm of Electrostatic Force Microscopy Based on the Singular Value Decomposition Combined with the Discrete Fourier Transform
- Force Imaging of Optical Near-Field Using Noncontact Mode Atomic Force Microscopy
- Simulated Computed Tomography for the Reconstruction of Vacancies Using an Atomic Force Microscope Image
- Charge Dissipation on Chemically Treated Thin Silicon Oxide in Air