スポンサーリンク
Department of Materials Science and Engineering, National Defense Academy, 1-10-20 Hashirimizu, Yokosuka, Kanagawa 239-8686, Japan | 論文
- Nondestructive Testing Technique for Defect Detection in LiNbO3 Using Infrared Thermal Imaging Camera
- Studies of Defects and Thermal Conductivity of Mixed Polytype in 6H-SiC Single Crystal by Polarized Optical Microscopy, Light Scattering Tomography, and Thermal Microscopy
- Electrochemical Oscillation in Electrohydrodynamic Fluid
- Superimposed Emissions on Enhanced Green Emission from ZnO:Pr Powders by Evacuated Sealed Silica Tube Method
- Direct Measurement of Optical Absorption for Si–Ge–Au Amorphous Thin Films by Using Photoacoustic Spectroscopy
- Defect Distribution in N-Doped and Semi-Insulating 6H-SiC Bulk Single Crystal Wafers Observed by Two- and Three-Dimensional Light Scattering Tomography
- Annealing Temperature Dependence of Crystallization Process of SiGeAu Thin Film
- The Measurement of Annealing Cycle Effect of Si–Ge–Au Amorphous Thin Film with Anomalously Large Thermoelectric Power by Using Photoacoustic Spectroscopy