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Department of Electronics, Faculty of Engineering, Kobe University | 論文
- Raman Microprobe Study on Relaxation of Residual Stresses in Patterned Silicon-on-Sapphire
- Laser-Oscillating-Mode Dependence of Temperature Distributions in Laser Annealing of Semiconductors
- Relief of Residual Strain in Silicon-on-Sapphire by Heat-Assisted Pulsed-Laser Annealing
- Anomalous Residual-Stress in Pulsed-Laser-Annealed Silicon-on-Sapphire Revealed by Raman Scattering
- Photoacoustic Spectra in Ternary Semiconducting Compound CdIn_2S_4 : Photo-Acoustic Spectroscopy
- Factor(s) Protecting Pyruvate Orthophosphate Dikinase of Panicum maximum against Cold-Inactivation
- Effects of Metal on the Dispersion Relation of Magnetostatic Surface Waves
- Pseudo-Line-Shaped Temperature Distribution Produced by Two-Dimensional Scanning with a Circular Gaussian Electron Beam