スポンサーリンク
Department of Electronic Science and Engineering, Kyoto University, Yoshida-Honmachi, Sakyo, Kyoto 606-8501, Japan | 論文
- Analysis of the Temperature Characteristics in Polycrystalline Si Solar Cells Using Modified Equivalent Circuit Model
- Surface Potential Measurement of Oligothiophene Ultrathin Films by Kelvin Probe Force Microscopy
- Nanoscale Investigation of Optical and Electrical Properties by Dynamic-Mode Atomic Force Microscopy Using a Piezoelectric Cantilever
- Nanoscale Electrical Properties of Molecular Films in the Vicinity of Platinum Ultrathin Film Electrode
- Impurity Doping and Electrical Properties of GaAsP Heteroepitaxially Grown on GaP and Si by Metalorganic Molecular Beam Epitaxy
- Fabrication of Nanogap Electrodes Using Ultrathin Metal Film