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Department of Computer Science and Engineering Waseda University | 論文
- C-5 A Software/Hardware Codesign for MPEG Encoder
- High-Level Area/Delay/Power Estimation for Low Power System VLSIs with Gated Clocks(Special Section of Selected Papers from the 14th Workshop on Circuits and Systems in Karuizawa)
- A New Hardware/Software Partitioning Algorithm for DSP Processor Cores with Two Types of Register Files(Special Section on VLSI Design and CAD Algorithms)
- Area and Delay Estimation in Hardware/Software Cosynthesis for Digital Signal Processor Cores(Special Section on VLSI Design and CAD Algorithms)
- An Area/Time Optimizing Algorithm in High-Level Synthesis of Control-Based Hardwares (Special Section on Discrete Mathematics and Its Applications)
- CAM Processor Synthesis Based on Behavioral Descriptions (Special Section on VLSI Design and CAD Algorithms)
- A Hardware / Software Cosynthesis System for Digital Signal Processor Cores with Two Types of Register Files (Special Section of Selected Papers from the 12th Workshop on Circuit and Systems in Karuizawa)
- AUGMENTED MALONDIALDEHYDE PRODUCTION BY PLATERETS FROM PATIENTS WITH CEREBROVASCULAR DISORDERS
- A QUALITATIVE OBSERVATION OF SERUM LIPOPROTEINS BY POLYACRYLAMIDE GEL DISC ELECTROPHORESIS IN CEREBROVASCULAR PATIENTS WITH SPECIAL REFERENCE TO MID-BAND LIPOPROTEINS IN NORMOLIPIDEMIC SUBJECTS
- Direct-Detection Optical Synchronous CDMA Systems with Interference Canceller Using Group Information Codes (Special Section on Spread Spectrum Techniques and Applications)
- Optical Spread Time CDMA Communication Systems with PPM Signaling
- Performance Analysis of Optical Frequency-Domain Encoding CDMA Enhancement of Frequency Division Multiplexing
- A Two-Level Cache Design Space Exploration System for Embedded Applications
- An L1 Cache Design Space Exploration System for Embedded Applications
- A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation(Timing Verification and Test Generation)(VLSI Design and CAD Algorithms)
- A Built-in Reseeding Technique for LFSR-Based Test Pattern Generation
- A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction(Test)(VLSI Design and CAD Algorithms)
- A Hybrid Dictionary Test Data Compression for Multiscan-Based Designs(Test)(VLSI Design and CAD Algorithms)
- A CAM-Based Parallel Fault Simulation Algorithm with Minimal Storage Size
- A Scan-Based Attack Based on Discriminators for AES Cryptosystems