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Department Of Physics Faculty Of Science Hiroshima University | 論文
- Coulomb Excitation of ^Nb
- 原子間力顕微鏡によるエバネセント波の検出
- Deep Level Study in Heteroepitaxial 3C-SiC Grown on Si by Hexamethyldisilane : Electrical Properties of Condensed Matter
- Observation of GaAs(110) Surface by an Ultrahigh-Vacuum Atomic Force Microscope
- Atomically Resolved Image of Cleaved GaAs(110) Surface Observed with an Ultrahigh Vacuum Atomic Force Microscope
- The Optical Absorption in Cubic PbF_2 Crystal Induced with γ-Ray Irradiation at Liquid-Helium Temperature
- Metal-Insulator Transition in Bi_xV_8O_ : ^V NMR Study
- Rare Earth Substitution Effects and Magnetic Field Dependence of Critical Current in Y_RE_xBa_2Cu_3O_y Coated Conductors with Nanoparticles (RE = Sm, Gd)
- Enhancement of Flux Pinning in Y_Sm_xBa_Cu_3O_y Coated Conductors with Nanoparticles
- Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling
- Non-destructive Analysis of Buried Interfaces and Surface Layers: X-Ray Emission Spectroscopic Study
- Valence Band Density of States of Cu_3Si Studied by Soft X-Ray Emission Spectroscopy and a First-Principle Molecular Orbital Calculation(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Study on Ti/C-teminated 4H- and 6H-SiC interface reactions by soft X-ray emission spectroscopy (SXES)
- Application of Monte Carlo Simulation to a Structural Analysis for Two-Layered/Substrate System
- Application of Monte Carlo Simulation to Structural Analysis by Soft X-Ray Emission Spectroscopy for a Silicide/Si-Bulk System
- Mn (Thin-Film)/Si (Substrate) Contacts: Analysis of the Buried Interface by Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Manganess Silicides Studied by Soft X-Ray Emission Spectroscopy
- Analysis of Heat-Treated 6H-SiC (0001) Surface Using Scanning Tunneling Microscopy
- Study of Cr Silicide Formation on Si(100) Due to Solid-Phase Reaction Using Soft X-Ray Emission Spectroscopy
- Valence Band Density of States of the Iron Silicides Studied by Soft X-Ray Emission Spectroscopy