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Department Of Electrical Engineering Kure National College Of Technology | 論文
- Formation of Boron Nitride (BN) Fullerene-Like Nanoparticles and (BN)_xC_y Nanotubes Using Carbon Nanotubes as Templates
- Classification of Driving Methods for TFT-OLEDs and Novel Proposal Using Time Ratio Grayscale and Current Uniformization(Electronic Displays)
- 表側と裏側の絶縁膜界面にトラップ準位をもつポリシリコン薄膜トランジスタのデバイスシミュレーション(ディスプレイ-IDW'03関連-)
- Numerical Model of Thin-Film Transistors for Circuit Simulation Using Spline Interpolation with Transformation by y=x + log(x)(Regular Section)
- Current Density Enhancement at Active Layer Edges in Polycrystalline Silicon Thin-Film Transistors : Semiconductors
- Hole-doping and Pressure Effects on the Metal-Insulator Transition in Single Crystals of Y_Ca_xTiO_3(0.37 ≤ x ≤ 0.41)(Condensed Matter : Electronic Structure, Electrical, Magnetic and Optical Properties)
- Hole-doping and Pressure Effects on the Metal-Insulator Transition in Single Crystals of Y_Ca_xTiO_3 (0.37≦x≦0.41)
- Device Simulation of Carrier Transport through Grain Boundaries in Lightly Doped Polysilicon Films and Dependence on Dopant Density : Semiconductors
- Current Paths over Grain Boundaries in Polycrystalline Silicon Films : Semiconductors
- High-resolution analytical electron microscopy of boron nitrides laser heated at high pressure
- Superconductivity in the Bi-Sr-La-Cu-O System : Electrical Properties of Condensed Matter
- Identification of a High-T_c Superconducting Phase in the Bi-Ca-Sr-Cu-O System : Electrical Properties of Condensed Matter
- Structure and Composition Analysis of High-T_c Superconducting Bi-Ca-Sr-Cu-O Oxide by High-Resolution Analytical Electron Microscopy : Electrical Properties of Condensed Matter
- A 400 kV High Resolution-Analytical Electron Microscope Newly Constructed
- 二次元空間における量子ダイナミックス
- Regeneration of the abdominal postganglionic sympathetic system
- Magnetic Behavior of Fe Doped In_2O_3
- In situ electrical measurements and manipulation of B/Ndoped C nanotubes in a high-resolution transmission electron microscope
- New 300kV Energy-Filtering Field Emission Electron Microscope : Instrumentation, Measurement, and Fabrication Technology
- Temperature dependency of radiation damage in inorganic materials by 300 keV electrons