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Department Of Electrical And Electronic Engineering And Computer Science Graduate School Of Science | 論文
- A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
- On Finding Don't Cares in Test Sequences for Sequential Circuits(Dependable Computing)
- Generation of Test Sequences with Low Power Dissipation for Sequential Circuits(Test Generation and Compaction)(Test and Verification of VLSI)
- Post-BIST Fault Diagnosis for Multiple Faults
- Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets(Test)(Dependable Computing)
- An Alternative Test Generation for Path Delay Faults by Using N_i-Detection Test Sets
- Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation(Special Issue on Test and Verification of VLSI)
- A Method of Test Generation for Iterative Logic Arrays (特集:VLSIプロセッサ及び新アーキテクチャLSI技術,一般)
- A Method of Test Generation for Iterative Logic Arrays (特集 VLSIプロセッサ及び新アーキテクスチャLSI技術、一般)
- A Method of Test Generation for Iterative Logic Arrays (特集:VLSIプロセッサ及び新アーキテクチャLSI技術,一般)
- Variation of Electron Diffraction Intensities with Energy Loss. : I. Gold, Silver and Aluminium Films
- Variation of Electron Diffraction Intensities with Energy Loss. : II. NaCl, CuCl and BiOCl Films
- Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
- A Simple Electrostatic Energy Filter for Electron Diffraction and Electron Microscopy