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Department Of Chemistry Faculty Of Engineering Science And Research Center For Photoenergetics Of Or | 論文
- Spectroscopic and Theoretical Studies of Interface States at Ultrathin Oxide/Si Interfaces
- Interface States at Ultrathin Chemical Oxide/Silicon Interfaces Obtained from Measurements of XPS Spectra under Biases
- Interface States for Si-Based MOS Devices with an Ultrathin Oxide Layer : X-Ray Photoelectron Spectroscopic Measurements under Biases
- Structure-Activity Relationships of Phenylethylamine Analogs in Their Serotonergic Depressant Effects on the Spinal Monosynaptic Reflex in Rats
- New Method for Observation of Interface States in the Semiconductor Band-Gap : XPS Measurements under Biases(Interfaces by various techniques)
- Direct Spectroscopic Evidence of Bias-Induced Shifts of Semiconductor Band Edges for Metal-Insulator-Semiconductor Diodes
- Oscillatory Behavior in Electrochemical Deposition Reaction of Polycrystalline Silicon Thin Films through Reduction of Silicon Tetrachloride in a Molten Salt Electrolyte
- Efficient Photoelectrochemical Reduction of Carbon Dioxide on a p-Type Silicon (p-Si) Electrode Modified with Very Small Copper Particles
- Efficient Implementation of Multi-Dimensional Array Redistribution
- An Efficient Data Distribution Technique for Distributed Memory Parallel Computers (特集:並列処理)
- An Efficient Data Distribution Technique for Distributed Memory Parallel Computers
- Subphthalocyanines Having Axial Substituent with Direct B-B Bond : General Preparation and Physical Properties
- 29. SPHYGMOGRAPH AND ELECTROCARDIOGRAPH IN ACTION
- Platinum-Enhanced Oxidation of Silicon : Formation of MOS Structure below 300℃
- Interface States for Ultrathin Chemical Oxide Layers on Si(111) and Si(100)
- Subphthalocyanine Derivatives Having a Phosphorus Group as an Axial Substituent
- μ-Oxo-Bridged Subphthalocyanine Dimers : Preparation and Characterization by X-ray Structure Analysis
- Spark lonization of Semi-metallic and Metallic Elements and of Ionic-crystals