スポンサーリンク
Central Research Laboratory, Nikon Corporation | 論文
- SiO_2/Si System Studied by Scanning Capacitance Microscopy
- Design and Fabrication of Monolithically Integrated Lateral-Electrode Etched-Mirror Laser with Y-Branch Single-Mode Waveguide in GaAs/AlGaAs
- Characterization of P- and N-Type Impurity Diffusions in GaAs from Doped Silica Films
- Fabrication of TE/TM Mode Splitter Using Completely Buried GaAs/GaAlAs Waveguide