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Center For Microelectronic Systems Kyushu Institute Of Technology | 論文
- Connection Test of Area Bump Using Active-Matrix Switches
- Dynamic Strain and Chip Damage during Ultrasonic Flip Chip Bonding
- Dynamic Strain and Its Distribution during Ultrasonic Flip Chip Bonding
- Direct Analysis of Permethrins in Human Blood by SPE-GC/MS
- Selective Phosphodiesterase Type 4 Inhibitors Reduce the Prolonged Survival of Eosinophils Stimulated by Granulocyte-Macrophage Colony-Stimulating Factor
- Induction of Histamine Release from Rat Peritoneal Mast Cells by Histatins
- CMOS Application of Single-Grain Thin Film Transistor Produced Using Metal Imprint Technology
- Low-Voltage-Signaling CMOS Receiver with Dynamic Threshold Control
- Low-Voltage-Signaling CMOS Receiver with Dynamic Threshold Control
- All-Optical Inverter Operating up to 850℃ in an Erbium-Doped Phosphate Glass
- Temperature Dependence of Negative Nonlinear Absorption Effect in an Erbium-doped Borate Glass
- All-Optical Inverter Operating with a 1.5 μm Laser in Erbium-Doped Phosphate Glass
- Reduction of Long-range Interactions using Carbon Nanotube Probes in Biological Systems
- Bias Effect on Compositional Separation in Sputtered Co-Cr Films
- Optimization of Transparent Conductive Oxide for Improved Resistance to Reactive and/or High Temperature Optoelectronic Device Processing
- NMR Study of Magnetic and Compositional Inhomogeneities in Co-Cr Thin Films
- Control of Orientation for Polycrystalline Silicon Thin Films Fabricated from Fluorinated Source Gas by Microwave Plasma Enhanced Chemical Vapor Deposition
- Single-Beam Overwrite with a New Erase Mode of In_3 SbTe_2 Phase-Change Optical Disks : Media
- Synthesis of Compositionally Graded A15 Nb-Si Films by Co-Sputtering
- Single-Beam Overwrite with a New Erase Mode of In_3SbTe_2 Phase-Change Optical Disks