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Base Technology Research Center Seiko Epson Corporation | 論文
- 24.4:Investigation of Hot Carrier Degradation Due to AC Stress in Low Temperature Poly-Si TFTs(発表概要)(Report on 2000 SID International Symposium)
- Pseudo-Lattice Method for Dynamic 3-D Liquid-Crystal Director Simulation
- First-Principles Investigation of Magneto-Optical Kerr Effect of Metallic Mutilayers
- Extraction of Trap States at the Oxide-Silicon Interface and Grain Boundary in Polycrystalline Silicon Thin-Film Transistors
- Device Simulation of Grain Boundaries in Lightly Doped Polysilicon Films and Analysis of Dependence on Defect Density