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Application and Research Center, Electron Optics Division, JEOL Ltd. | 論文
- A Novel Mapping Technique of Oxide Chemical States by Electron Probe Microanalysis
- State Analysis of Fluorides with Rare Earth Elements in Electron Probe X-Ray Microanalysis
- Application of Chemical State Mapping Technique with Electron Probe X-Ray Microanalyzer for BiSrCaCuO Superconductor
- Wide area mapping of uneven specimens in an electron probe X-ray microanalyser with wavelength dispersive spectrometers