スポンサーリンク
Advanced Manufacturing Research Institute, National Institute of Advanced Industrial Science and Technology (AIST), 1-2-1 Namiki, Tsukuba, Ibaraki 305-8564, Japan | 論文
- Fabrication of 150-nm-Wide Transducer Gaps for Disk-Type Resonators by Single Dry Etching Process
- Ultrasonic Nanoimprint on Poly(ethylene terephthalate) at Room Temperature
- Tip-to-Sample Distance Dependence of $dC/dZ$ Imaging in Thin Dielectric Film Measurement
- Correlation Between Surface Topography and Static Capacitance Image of Ultrathin SiO2 Films Evaluated by Scanning Capacitance Microscopy
- Development of Ni–P-Plated Inconel Alloy Mold for Imprinting on Pyrex Glass
- Capacitive Imaging of Graphene Flakes on SiO2 Substrate
- Evaluation of Domain Boundary of Piezo/Ferroelectric Material by Ultrasonic Atomic Force Microscopy
- Nanoimprint Lithography Combined with Ultrasonic Vibration on Polycarbonate
- Scanning Capacitance Microscopy Evaluation of Lead Zirconate Titanate Film Formed by Aerosol Deposition Method
- The Effect of Pile-Up and Contact Area on Hardness Test by Nanoindentation
- Decomposition of Volatile Organic Compounds Using Surface-Discharge Microplasma Devices
- Ultrasonic Nanoimprinting in Organic Spin-on-Glass-Coated Si Substrates