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Advanced Electron Microscope Group, Advanced Nano- Characterization Center, National Institute for Materials Science | 論文
- Effect of Quenched Disorder on Charge Ordering Structure in RE_AE_NiO_4(RE=La, Pr, Nd, Sm;AE=Ca, Sr)(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- Dopant-Dependent Impact of Mn-Site Doping on Critical-State Manganites R_Sr_MnO_3 (R=La, Nd, Sm, and Gd)(Condensed matter: electronic structure and electrical, magnetic, and optical properties)
- TEM study of the influence of antisite defects on magnetic domain structures in double perovskite Ba_2FeMoO_6
- Microstructural Observation of Si_Ge_x Thin Films Prepared by Pulsed Ion-Beam Evaporation
- HRTEM study of new series of oxycarbonitrate superconductors (Cu,C,N)(n=1-6)
- Light element analysis in oxycarbonate superconductors using EELS
- Nitrogen Distribution and Chemical Bonding State Analyses in Oxynitride Film by Spatially Resolved Electron Energy Loss Spectroscopy (EELS)
- Chemical shift mapping of Si L and K edges using spatially resolved EELS and energy-filtering TEM
- Two-Dimensional Boron Analysis in Borophosphosilicate Glass Film Using Transmission Electron Microscope with Imaging Filter
- Diffuse Phase Transition and Anisotropic Evolution of Nanodomains in Nd_Sr_MnO_3(Condensed matter : electronic structure and electrical, magnetic, and optical properties)
- Development of dedicated STEM with high stability
- The study of AI-L_23 ELNES with resolution-enhancement software and first-principles calculation
- Spatially-resolved EELS analysis of multilayer using EFTEM and STEM
- Fourier images feature of lattice fringes formed by low-loss electrons as observed using spatially-resolved EELS technique
- Elemental Mapping Using a Field Emission Transmission Electron Microscope with an Imaging Filter
- Quantitative Elemental Mapping of Stainless Steel Using an Imaging Filter
- Observations of Gold Atomic Clusters in Magnesium Oxide Films under Off-Bragg Conditions
- Elemental mapping and chemical shift analysis using energy-filtering transmission electron microscopy(Abstracts of Doctoral Dissertations,Annual Report (from April 1997 to March 1998))
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