OKUMA Yasuyuki | Semiconductor Technology Academic Research Center(STARC)
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概要
Semiconductor Technology Academic Research Center(STARC) | 論文
- Influence of Thermal Noise on Drain Current in Very Small Si-MOSFETs
- Influence of Intrinsic Current Fluctuation in Very Small Si-MOSFETs
- Current Fluctuation Characteristic of Sub-0.1 Micron Device Structures:A Monte Carlo Study
- Non-Quasi-Static Carrier Dynamics of MOSFETs under Low-Voltage Operation
- Probability Distribution of Threshold Voltage Fluctuations in Metal-OXide-Semiconductor Field-Effect-Transistors : Semiconductors