Kimura Yosuke | ASM, Tama, Tokyo 206-0025, Japan
スポンサーリンク
概要
関連著者
-
Kobayashi Akiko
ASM, Tama, Tokyo 206-0025, Japan
-
Kobayashi Nobuyoshi
ASM, Tama, Tokyo 206-0025, Japan
-
Kimura Yosuke
ASM, Tama, Tokyo 206-0025, Japan
-
Matsushita Kiyohiro
ASM, Tama, Tokyo 206-0025, Japan
-
Ishikawa Dai
ASM, Tama, Tokyo 206-0025, Japan
-
Nakano Akinori
ASM, Tama, Tokyo 206-0025, Japan
-
Roest David
ASM, Kapeldreef 75, B-3001 Leuven, Belgium
-
Ditmer Gary
Metryx Ltd., Bristol BS32 4SH, U.K.
-
Kiermasz Adrian
Metryx Ltd., Bristol BS32 4SH, U.K.
著作論文
- Impact of Hydrocarbon Control in Ultraviolet-Assisted Restoration Process for Extremely Porous Plasma Enhanced Chemical Vapor Deposition SiOCH Films with k = 2.0 (Special Issue : Advanced Metallization for ULSI Applications)
- Plasma-Enhanced Atomic Layer Deposition Sealing Property on Extreme Low-k Film with k = 2.0 Quantified by Mass Metrology