Kim Yihwan | Front End Products Group, Applied Materials Inc., Sunnyvale, CA 94085, U.S.A.
スポンサーリンク
概要
関連著者
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Ko Dae-hong
Department Of Ceramic Engineering Yonsei University
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Kim Jae-Hyun
Graduate School of EEWS, KAIST, Daejeon 305-701, Korea
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Kim Sun-Wook
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Jung Mijin
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Kim Yihwan
Front End Products Group, Applied Materials Inc., Sunnyvale, CA 94085, U.S.A.
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Lee Hoo-Jeong
Department of Advanced Materials Science and Engineering, Sungkyunkwan University, Suwon, Gyeonggi 440-746, Korea
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Byun Dae-Seop
Department of Materials Science and Engineering, Yonsei University, Seoul 120-749, Korea
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Chopra Saurabh
Front End Products Group, Applied Materials Inc., Sunnyvale, CA 94085, U.S.A.
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Han Seung-Min
Graduate School of EEWS, KAIST, Daejeon 305-701, Korea
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HAN Seung-Min
Graduate School of EEWS, KAIST
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LEE Hoo-Jeong
Department of Advanced Materials Science and Engineering, Sungkyunkwan University
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BYUN Dae-Seop
Department of Materials Science and Engineering, Yonsei University
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CHOPRA Saurabh
Front End Products Group, Applied Materials Inc.
著作論文
- Channel Strain Measurement of Si
- Channel Strain Measurement of Si_C_x Structures : Effects of Gate Length, Source/Drain Length, and Source/Drain Elevation