KOH Young-Bum | Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University
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- Koh Young-Bumの詳細を見る
- 同名の論文著者
- Faculty of Engineering Science and Research Center for Extreme Materials, Osaka Universityの論文著者
Faculty of Engineering Science and Research Center for Extreme Materials, Osaka University | 論文
- Well Structure by High-Energy Boron Implantation for Soft-Error Reduction in Dynamic Random Access Memories (DRAMs)
- Estimation of Carrier Suppression by High-Energy Boron-Implanted Layer for Soft Error Reduction
- Soft-Error Study of DRAMs with Retrograde Well Structure by New Evaluation Method (Special Issue on Quarter Micron Si Device and Process Technologies)
- Charge Collection Control Using Retrograde Well Tested by Proton Microprobe Irradiation
- New Method for Soft-Error Mapping in Dynamic Random Access Memory Using Nuclear Microprobe