Nakazaki Yoshiaki | Advanced LCD Technology Development Center Co., Ltd.
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概要
Advanced LCD Technology Development Center Co., Ltd. | 論文
- Characterization of High-Performance Polycrystalline Silicon Complementary Metal-Oxide-Semiconductor Circuits
- Optimum Light Intensity Distribution for Growing Large Si Grains by Phase-Modulated Excimer-Laser Annealing
- Deposition of Pure Hydrogenated Amorphous Silicon by Plasma-Enhanced Chemical Vapor Deposition for Polycrystalline Silicon Thin Film Transistors
- High-Resolution Beam Profiler for Engineering Laterally-Grown Grain Morphology(Electronic Displays)
- High-Resolution Beam Profiler for Engineering Laterally-Grown Grain Morphology