平野 健二 | Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan

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• 平野 健二の詳細を見る
• 同名の論文著者
• Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japanの論文著者

Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan | 論文

• Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
• Determination of Constant Strain Gradients of Elastically Bent Crystal Using X-ray Mirage Fringes
• X-ray Interference Fringes from Weakly Bent Crystal
• X-ray Interference Fringes in Transmitted Beam of Bragg Mode from Very Weakly Bent Crystal
• Amplification of Reflected X-ray Beams by the Mirage Effect

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