Yokogawa Shinji | Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
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概要
- Yokogawa Shinjiの詳細を見る
- 同名の論文著者
- Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japanの論文著者
関連著者
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Yokogawa Shinji
Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
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Yokogawa Shinji
Device and Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
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Tsuchiya Hideaki
Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
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Shimizu Tatsuo
Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
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Shimizu Tatsuo
Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan
著作論文
- Role of Impurity Segregation into Cu/Cap Interface and Grain Boundary in Resistivity and Electromigration of Cu/Low-$k$ Interconnects
- Thermal Transient Response and Its Modeling for Joule Heating in Cu/Low-κ Interconnects Under Pulsed Current (Special Issue : Advanced Metallization for ULSI Applications)