Yokogawa Shinji | Device and Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan

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概要

• Yokogawa Shinjiの詳細を見る
• 同名の論文著者
• Device and Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japanの論文著者

関連著者

• Yokogawa Shinji

  Device and Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan

• Yokogawa Shinji

  Device & Analysis Technology Division, Renesas Electronics Corporation, Sagamihara 229-1198, Japan

著作論文

• Role of Impurity Segregation into Cu/Cap Interface and Grain Boundary in Resistivity and Electromigration of Cu/Low-$k$ Interconnects

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