Fujisaki Yoshihide | NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
スポンサーリンク
概要
- Fujisaki Yoshihideの詳細を見る
- 同名の論文著者
- NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japanの論文著者
関連著者
-
SATO Hiroto
NHK Science & Technical Research Laboratories
-
FUJIKAKE Hideo
NHK Science & Technical Research Laboratories
-
FUJISAKI Yoshihide
NHK Science & Technical Research Laboratories
-
Yamamoto Toshihiro
Nhk Sci. & Technical Res. Lab. Tokyo Jpn
-
Nakajima Yoshiki
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Takei Tatsuya
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Nakata Mitsuru
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Tsuji Hiroshi
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Fujisaki Yoshihide
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Fujikake Hideo
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
-
Yamamoto Toshihiro
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
著作論文
- Analysis of the Influence of Sputtering Damage to Polymer Gate Insulators in Amorphous InGaZnO4 Thin-Film Transistors
- Influence of Oxide Semiconductor Thickness on Thin-Film Transistor Characteristics