Nakajima Yoshiki | NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
スポンサーリンク
概要
- Nakajima Yoshikiの詳細を見る
- 同名の論文著者
- NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japanの論文著者
関連著者
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SATO Hiroto
NHK Science & Technical Research Laboratories
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FUJIKAKE Hideo
NHK Science & Technical Research Laboratories
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FUJISAKI Yoshihide
NHK Science & Technical Research Laboratories
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Yamamoto Toshihiro
Nhk Sci. & Technical Res. Lab. Tokyo Jpn
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Nakajima Yoshiki
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Takei Tatsuya
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Nakata Mitsuru
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Tsuji Hiroshi
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Fujisaki Yoshihide
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Suzuki Mitsunori
Nhk Science And Technical Research Laboratories
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Fujikake Hideo
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Fukagawa Hirohiko
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Motomura Genichi
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Tokito Shizuo
Yamagata University, Graduate School of Science and Engineering, Yonezawa, Yamagata 992-8510, Japan
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Suzuki Mitsunori
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Sato Hiroto
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
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Yamamoto Toshihiro
NHK Science and Technology Research Laboratories, Setagaya, Tokyo 157-8510, Japan
著作論文
- New Driving Scheme to Improve Hysteresis Characteristics of Organic Thin Film Transistor-Driven Active-Matrix Organic Light Emitting Diode Display
- Analysis of the Influence of Sputtering Damage to Polymer Gate Insulators in Amorphous InGaZnO4 Thin-Film Transistors
- Influence of Oxide Semiconductor Thickness on Thin-Film Transistor Characteristics