LING C. | Department of Electrical Enginecering, National Universiry of Singapore

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概要

• 同名の論文著者
• Department of Electrical Enginecering, National Universiry of Singaporeの論文著者

関連著者

• LING C.

  Department of Electrical Enginecering, National Universiry of Singapore

• Ling C

  National Univ. Singapore Singapore

• Ling C.

  Department Of Electrical Engineering National University Of Singapore

著作論文

• Identification of Fixed and Interface Trap Charges in Hot-Carrier Stressed Metal Oxide Semiconductor Field Effect Transistors (MOSFET's) through Ultraviolet Light Anneal and Gate Capacitance Measurements
• Electron Trapping and Interface State Generation in PMOSFET's: Results from Gate Capacitance

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