Ling C. | Department Of Electrical Engineering National University Of Singapore
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概要
関連著者
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Ling C.
Department Of Electrical Engineering National University Of Singapore
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Ling C
National Univ. Singapore Singapore
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Ling C.h.
Department Of Electrical Engineering National University Of Singapore
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ANG D.
Department of Electrical Engineering, National University of Singapore
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Ang D.
Department Of Electrical Engineering National University Of Singapore
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Ang D.S.
Department of Electrical Engineering, National University of Singapore
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LING C.
Department of Electrical Enginecering, National Universiry of Singapore
著作論文
- Identification of Fixed and Interface Trap Charges in Hot-Carrier Stressed Metal Oxide Semiconductor Field Effect Transistors (MOSFET's) through Ultraviolet Light Anneal and Gate Capacitance Measurements
- Effects of Tungsten Polycidation on the Hot-Carrier Degradation in Buried-Channel LDD p-MOSFET's