ARIYOSHI Hisashi | The Electrical Communication Laboratory, Nippontelegraph and Telephone Public Corporation
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- 同名の論文著者
- The Electrical Communication Laboratory, Nippontelegraph and Telephone Public Corporationの論文著者
The Electrical Communication Laboratory, Nippontelegraph and Telephone Public Corporation | 論文
- Induced Stress-Sensitivity of Ion-Bombarded Silicon-Metal Contacts
- Negative Resistance in Compensated Silicon Diodes
- Stress Effect of Gold-Doped and Gamma-Irradiated Schottky-Barrier Diodes
- Effect of Surface Polishing on the Stress-Sensitivity of a Schottky-Barrier Diode