IMAI Atsuo | Toshiba Research and Development Center, Tokyo Shibaura Electric Co., Ltd.
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概要
Toshiba Research and Development Center, Tokyo Shibaura Electric Co., Ltd. | 論文
- Correlation between Dislocation Pits in GaP LPE Layers and LEC Substrates
- Characterization of Computer Controlled Gap Single Crystals : C-2: III-V CRYSTALS/JOSEPHSON JUNCTION
- A Focused-Beam Type Laser Interferometric Dilatometer : Interferometry
- A New Instability in MOS Transistor Caused by Hot Electron and Hole Injection from Drain Avalanche Plasma into Gate Oxide
- Notes on Compressible Gasket and Bridgman-Anvil Type High Pressure Apparatus