Characterization of Computer Controlled Gap Single Crystals : C-2: III-V CRYSTALS/JOSEPHSON JUNCTION

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概要

• 論文の詳細を見る
• 社団法人応用物理学会の論文
• 1983-02-28

著者

• KOKUBUN Yoshihiro

  Toshiba Materials and Devices Laboratories

• WATANABE Masayuki

  Toshiba Research and Development Center, Tokyo Shibaura Electric Co., Ltd.

• USHIZAWA Jisaburo

  Toshiba Research and Development Center, Toshiba Corporation

• Watanabe Masayuki

  Toshiba Research And Development Center

• WASHIZUKA Shoichi

  Toshiba Research and Development Center

• Ushizawa Jisaburo

  Toshiba Research And Development Center

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• Correlation between Dislocation Pits in GaP LPE Layers and LEC Substrates
• Growth and Properties of Li_2B_4O_7 Single Crystal for SAW Device Applications : V: PIZOELECTRIC VIBRATOR
• Characterization of Computer Controlled Gap Single Crystals : C-2: III-V CRYSTALS/JOSEPHSON JUNCTION

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