Negishi Riichirou | Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan
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- 同名の論文著者
- Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japanの論文著者
Saitama Institute of Technology, Fukaya, Saitama 369-0293, Japan | 論文
- Two-Beam X-ray Interferometer Using Diffraction in Multiple Bragg--Laue Mode
- Determination of Constant Strain Gradients of Elastically Bent Crystal Using X-ray Mirage Fringes
- X-ray Interference Fringes from Weakly Bent Crystal
- X-ray Interference Fringes in Transmitted Beam of Bragg Mode from Very Weakly Bent Crystal
- Amplification of Reflected X-ray Beams by the Mirage Effect